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SPM probe - List of Manufacturers, Suppliers, Companies and Products

SPM probe Product List

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AFM/SPM probes and cantilevers for roughness measurement of various industrial materials.

AFM/SPM probes and cantilevers for roughness measurement of various industrial materials.

Cost measures and wear prevention products! NanoWorld probes with a high track record for everyday measurements.

We would like to introduce our "AFM/SPM Probes and Cantilevers" for measuring the roughness of various industrial materials. These products are suitable for customers using AFM/SPM for nano-level surface management of materials. Please use the NCH probes, which have a proven track record worldwide, the BudgetSensors probes, which are cost-effective, and the nanotools probes, which enhance tip wear resistance and allow for long-duration measurements. 【Features】 ■ For measuring the roughness of various industrial materials ■ Suitable for customers using AFM/SPM for nano-level surface management of materials ■ Enhanced tip wear resistance allows for long-duration measurements *For more details, please refer to the related link page or feel free to contact us.

  • Other microscopes
  • Other physicochemical equipment
  • 3D measuring device

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[Standard Type] AFM/SPM Probe

[Standard Type] AFM/SPM Probe

High cost-performance AFM/SPM probes

This is a probe for atomic force microscopy and scanning probe microscopy. It can be used for a wide range of applications. With a reflective coating (Au, Al), it enables high-sensitivity measurements, and you can choose from many models with different cantilever shapes, resonance frequencies, and force constants that are suitable for your samples. Conductive coatings (Au, Pt, TiN, W2C), magnetic coatings, and bare probes without back coatings are also available. - Golden Probe: An excellent probe with an Au reflective coating and a curvature radius of 6 nm (typical). - ETALON Probe: An inexpensive probe with controlled tolerances for resonance frequency and force constant. It has different types of cantilevers at both ends of the chip. - TOP VISUAL Probe: A protruding probe that allows observation of the tip position from directly above, enabling precise positioning on the sample surface.

  • Other microscopes
  • Analytical Equipment and Devices
  • probe

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AFM/SPM Probes and Cantilevers for Polymer Material Research and Development

AFM/SPM Probes and Cantilevers for Polymer Material Research and Development

Suitable for high polymer materials with a slightly lower spring constant than conventional non-contact tapping mode probes.

We would like to introduce our "AFM/SPM Probes and Cantilevers" for polymer material research and development. For tapping mode measurements of polymers with relatively soft surfaces, soft tapping probes are ideal. Additionally, we offer colloid probes suitable for localized viscoelastic measurements, friction force measurements, and modulation response measurements, which have been in high demand in recent years. 【Features】 The NanoWorld Pointprobe NCL is designed for non-contact mode and tapping mode. It combines a low spring constant, high measurement stability, excellent sensitivity, and high-speed measurement capabilities. The tip shape is a polygon close to a pyramid. *For more details, please refer to the PDF document or feel free to contact us.

  • Other physicochemical equipment
  • Other microscopes
  • 3D measuring device

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AFM/SPM Probes and Cantilevers for Measuring Electrical Properties of Nanomaterials

AFM/SPM Probes and Cantilevers for Measuring Electrical Properties of Nanomaterials

Introducing a conductive film coat probe suitable for measuring the electrical properties of various materials.

We would like to introduce our "AFM/SPM Probes and Cantilevers" for measuring the electrical properties of nanomaterials. For localized electrical property measurements, probes with metal film coatings are preferable. While platinum coating is the standard, you can also use platinum silicide or conductive diamond-coated types that enhance wear resistance during contact. 【Features】 ■ For measuring the electrical properties of nanomaterials ■ Probes with metal film coatings are suitable for localized electrical property measurements ■ Platinum silicide and conductive diamond-coated types are also available *For more details, please refer to the related link page or feel free to contact us.

  • Other physicochemical equipment
  • Other microscopes
  • 3D measuring device

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AFM/SPM Probes and Cantilevers for Biomaterial Measurement

AFM/SPM Probes and Cantilevers for Biomaterial Measurement

A liquid probe equipped with a low spring constant cantilever suitable for measuring soft samples in liquid.

We would like to introduce our "AFM/SPM Probes and Cantilevers" for bio-sample and biomaterial measurement. In recent years, there has been a growing demand from customers for the measurement of surface shapes and viscoelasticity of cells and biomolecules, which requires special cantilevers with extremely soft spring constants. 【Features】 ■ Versatile SPM/AFM probes suitable for a wide range of applications ■ Designed for both contact mode and dynamic mode ■ Compatible with almost all commercially available SPM/AFM systems <PNP Series> ■ Cantilevers and probes made of silicon nitride ■ Support tips made of Pyrex glass ■ Individually separated chips for easy handling <uniqprobe Series> Probes with smaller dimensional specifications and material-specific warping and bending compared to Si probes and SiN probes. *For more details, please refer to the PDF document or feel free to contact us.

  • Other physicochemical equipment
  • 3D measuring device
  • Other microscopes

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